2 产品
| 图片 | 型号 | 价格 | 数量 | 库存 | 制造商 | 描述 | Package / Case | Series | Packaging | Mounting Type | Part Status | Voltage - Supply | Supplier Device Package | Applications | Interface | |
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查看 | Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | 64-LQFP | SCOPE™, Widebus™ | Tape & Reel (TR) | Surface Mount | Obsolete | 2.7 V ~ 3.6 V | 64-LQFP (10x10) | Circuit Board Testing | 4-Wire Test Access Port (TAP) | |||
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查看 | Texas Instruments | IC ABT SCAN TEST DEV 3.3V 64LQFP | 64-LQFP | SCOPE™, Widebus™ | Tape & Reel (TR) | Surface Mount | Obsolete | 2.7 V ~ 3.6 V | 64-LQFP (10x10) | Circuit Board Testing | 4-Wire Test Access Port (TAP) |
